Optimized Test compression bandwidth management for Ultra-large-Scale System-on-Chip Architectures performing Scan Test Bandwidth Management
Authors:
P.ANNAPURNA ,Mr.T.RAJASHEKAR ,Mr.G.BABU
Page No: 183 - 193
Abstract:
This paper presents several techniques employed to resolve problems surfacing when applying scan bandwidth management to large industrial multicore system-on-chip (SoC) designs with embedded test data compression.
Description:
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Volume & Issue
Volume-1,ISSUE-2
Keywords
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